Reliability physics 1990 : 28th annual proceedings, New Orleans, Louisiana, March 27, 28, 29, 1990 /

Bibliographic Details
Corporate Authors:	International Reliability Physics Symposium New Orleans, La., IEEE Electron Devices Society, IEEE Reliability Society
Format:	Conference Proceeding Book
Language:	English
Published:	New York, N.Y. (345 E. 47th St., New York 10017) : Institute of Electrical and Electronics Engineers, [1990]
Subjects:	Electronic apparatus and appliances > Reliability > Congresses.

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