Fringe pattern analysis : 8-9 August 1989, San Diego, California /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory, International Symposium on Optical and Optoelectronic Applied Sciences and Engineering
Other Authors:	Reid, Graeme T.
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1989]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1163.
Subjects:	Diffraction patterns > Congresses. Interferometry > Congresses. Speckle > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1163.toc?SSO=1

Description
Item Description:	"... Part of a four-conference program on Interferometry, Microscopy, and Testing held at SPIE's 33rd Annual International Symposium on Optical & Optoelectronic Applied Science & Engineering"--P. v.
Physical Description:	vi, 260 pages : illustrations ; 28 cm.
Bibliography:	Includes bibliographies and index.
ISBN:	0819401994 (pbk.)