Fringe pattern analysis : 8-9 August 1989, San Diego, California /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory, International Symposium on Optical and Optoelectronic Applied Sciences and Engineering
Other Authors:	Reid, Graeme T.
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1989]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1163.
Subjects:	Diffraction patterns > Congresses. Interferometry > Congresses. Speckle > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/1163.toc?SSO=1

Remote Storage