X-ray/EUV optics for astronomy and microscopy /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory
Other Authors:	Hoover, Richard B.
Format:	Book
Language:	English
Published:	Bellingham, Washington, USA : SPIE, [1989]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1160.
Subjects:	X-ray astronomy > Congresses. Ultraviolet astronomy > Congresses. X-ray microscopes > Congresses. Optical images > Congresses.

Remote Storage