Automated inspection and high speed vision architectures II : 10-11 November, 1988, Cambridge, Massachusetts /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Carnegie-Mellon University. Center for Optical Data Processing
Other Authors:	Chen, Michael J. W.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [1989]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 1004.
Subjects:	Quality control > Optical methods > Automation > Congresses. Computer vision > Congresses.

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