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Testing and reliable design of CMOS circuits /

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Bibliographic Details
Main Author: Jha, Niraj K.
Other Authors: Kundu, Sandip
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [1990]
Series:Kluwer international series in engineering and computer science ; SECS 88.
Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:
Metal oxide semiconductors, Complementary > Testing.
Metal oxide semiconductors, Complementary > Reliability.
Integrated circuits > Very large scale integration > Design and construction.
Description
Physical Description:xii, 231 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0792390563