Testing and reliable design of CMOS circuits /

Bibliographic Details
Main Author:	Jha, Niraj K.
Other Authors:	Kundu, Sandip
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, [1990]
Series:	Kluwer international series in engineering and computer science ; SECS 88. Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:	Metal oxide semiconductors, Complementary > Testing. Metal oxide semiconductors, Complementary > Reliability. Integrated circuits > Very large scale integration > Design and construction.

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