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Hierarchical modeling for VLSI circuit testing /

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Bibliographic Details
Main Author: Bhattacharya, Debashis, 1961-
Other Authors: Hayes, John P. (John Patrick), 1944-
Format: Book
Language:English
Published: Boston : Kluwer Academic Publishers, [1990]
Series:Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Computer simulation.
Description
Physical Description:x, 159 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:079239058X