Hierarchical modeling for VLSI circuit testing /

Bibliographic Details
Main Author:	Bhattacharya, Debashis, 1961-
Other Authors:	Hayes, John P. (John Patrick), 1944-
Format:	Book
Language:	English
Published:	Boston : Kluwer Academic Publishers, [1990]
Series:	Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Subjects:	Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Computer simulation.

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