Cover Image

Optical testing and metrology II : 27-30 June 1988, Dearborn, Michigan /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Engineering Society of Detroit, New Mexico State University. Applied Optics Laboratory
Other Authors: Grover, C. P.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1989]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 954.
Subjects:
Measurement > Congresses.
Optical measurements > Congresses.
Description
Physical Description:viii, 725 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographies and index.
ISBN:089252989X