Optical testing and metrology II : 27-30 June 1988, Dearborn, Michigan /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Engineering Society of Detroit, New Mexico State University. Applied Optics Laboratory
Other Authors:	Grover, C. P.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1989]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 954.
Subjects:	Measurement > Congresses. Optical measurements > Congresses.

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