Piece recognition and image processing : 30 June 1988, Dearborn, Michigan /

Bibliographic Details
Corporate Authors:	Engineering Society of Detroit, Society of Photo-optical Instrumentation Engineers, New Mexico State University. Applied Optics Laboratory
Other Authors:	Wiitanen, Wayne
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1988]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 956.
Subjects:	Optical pattern recognition > Congresses. Image processing > Congresses.

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