Cover Image

Meeting the tests of time : International Test Conference, 1989 proceedings, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC /

Bibliographic Details
Corporate Authors: International Test Conference Washington, D.C., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : IEEE Computer Society Press, [1989]
Subjects:
Integrated circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Automatic test equipment > Congresses.
Description
Item Description:"Computer Society order number 1962."
"IEEE catalog number 89CH2742-5."
"20 Anniversary."
Cover title: 1989 IEEE International Test Conference.
Physical Description:xxxiv, 959 pages : illustrations ; 29 cm.
Bibliography:Includes bibliographies and index.
ISBN:0818659629 (microfiche)
0818689625 (hard)