Meeting the tests of time : International Test Conference, 1989 proceedings, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC /

Bibliographic Details
Corporate Authors:	International Test Conference Washington, D.C., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, D.C. : IEEE Computer Society Press, [1989]
Subjects:	Integrated circuits > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Automatic test equipment > Congresses.

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