Accuracy in trace analysis : sampling, sample handling, analysis /

Bibliographic Details
Corporate Authors:	Materials Research Symposium Gaithersburg, Md., United States. National Bureau of Standards
Other Authors:	LaFleur, Philip D. (Editor)
Format:	Government Document Conference Proceeding Book
Language:	English
Series:	NBS special publication ; 422.
Subjects:	Trace elements > Analysis > Congresses. Chemistry Techniques, Analytical > congresses. Trace Elements > congresses.

Description
Item Description:	CODEN: XNBSAV
Physical Description:	2 volumes (xiii, 1304 pages, 1 unnumbered page) : illustrations ; 24 cm.
Bibliography:	Includes bibliographies.