Accuracy in trace analysis : sampling, sample handling, analysis /

Bibliographic Details
Corporate Authors:	Materials Research Symposium Gaithersburg, Md., United States. National Bureau of Standards
Other Authors:	LaFleur, Philip D. (Editor)
Format:	Government Document Conference Proceeding Book
Language:	English
Series:	NBS special publication ; 422.
Subjects:	Trace elements > Analysis > Congresses. Chemistry Techniques, Analytical > congresses. Trace Elements > congresses.

Evans: US Documents (Annex 5th floor)