Cover Image

VLSI testing /

Bibliographic Details
Other Authors: Williams, T. W., 1943-
Format: Book
Language:English
Published: Amsterdam ; New York : North-Holland ; 1986
Series:Advances in CAD for VLSI ; v. 5.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Description
Physical Description:ix, 275 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographies.
ISBN:0444878955 (U.S.)