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VLSI testing /

Bibliographic Details
Other Authors: Williams, T. W., 1943-
Format: Book
Language:English
Published: Amsterdam ; New York : North-Holland ; 1986
Series:Advances in CAD for VLSI ; v. 5.
Subjects:
Integrated circuits > Very large scale integration > Testing.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .V5666 1986
 
Call Number Status Get It
TK7874 .V5666 1986 Available