Imaging and evaluation of latch-up sites in CMOS Integrated Circuits /

Bibliographic Details
Main Author:	Antoniou, Nicholas
Format:	Thesis eBook
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1988.
Subjects:	Integrated circuits > Testing. Metal oxide semiconductors, Complementary. Major electrical engineering.
Online Access:	Link to OAKTrust copy

Description
Item Description:	"Major subject: Electrical Engineering." Typescript (photocopy). Vita.
Physical Description:	x, 95 leaves : illustrations ; 29 cm. Also available online.
Bibliography:	Bibliography: leaves 63-67.