Imaging and evaluation of latch-up sites in CMOS Integrated Circuits /

Bibliographic Details
Main Author:	Antoniou, Nicholas
Format:	Thesis eBook
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1988.
Subjects:	Integrated circuits > Testing. Metal oxide semiconductors, Complementary. Major electrical engineering.
Online Access:	Link to OAKTrust copy

Link to OAKTrust copy

Remote Storage

Holdings details from Remote Storage
Call Number	Status	Get It
Call Number:		1988 Thesis A635
Notes:		Cushing Archival Copy (Library Use Only)

1988 Thesis A635	Available