Cover Image

Ellipsometry for industrial applications /

Show other versions (1)
Bibliographic Details
Main Author: Riedling, Karl, 1948-
Format: Book
Language:English
Published: Wien ; New York : Springer-Verlag, [1988]
Subjects:
Thin films > Measurement.
Ellipsometry > Industrial applications.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7872.T55 R54 1988
 
Call Number Status Get It
TK7872.T55 R54 1988 Available