Cover Image

Proceedings of the 1st European Test Conference : Paris, April 12-14, 1989.

Bibliographic Details
Corporate Authors: European Test Conference Paris, France, Société des électriciens et des électroniciens, IEEE Computer Society
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : IEEE Computer Society Press, [1989]
Subjects:
Integrated circuits > Testing > Congresses.
Electronic circuits > Testing > Congresses.
Description
Item Description:Cover title: 1989 European Test Conference.
"Société des électriciens et des électroniciens."
"IEEE Computer Society."
"IEEE Computer Society order number 1937."
"IEEE catalog number 89CH2696-3."
Physical Description:xiv, 417 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references.
ISBN:0818619376 (paper)
0818659378 (microfiche)
0818689374 (case)