Proceedings of the 1st European Test Conference : Paris, April 12-14, 1989.

Bibliographic Details
Corporate Authors:	European Test Conference Paris, France, Société des électriciens et des électroniciens, IEEE Computer Society
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, D.C. : IEEE Computer Society Press, [1989]
Subjects:	Integrated circuits > Testing > Congresses. Electronic circuits > Testing > Congresses.

Remote Storage