An investigation of current noise measurement on hybrid Ta₂N-Cr-Au thin film resistors and their relationship to film adhesion /

Bibliographic Details
Main Author: Bibeau, Wayne Edward
Format: Thesis eBook
Language:English
Published: [College Station, Tex.] : Bibeau, 1978.
Subjects:
Online Access:Link to OAKTrust copy
Description
Item Description:"Major subject: Electrical Engineering."
Vita.
Physical Description:vii, 87 leaves : illustrations ; 28 cm.
Also available online.
Bibliography:Bibliography: leaves 81-85.