An investigation of current noise measurement on hybrid Ta₂N-Cr-Au thin film resistors and their relationship to film adhesion /

Bibliographic Details
Main Author: Bibeau, Wayne Edward
Format: Thesis eBook
Language:English
Published: [College Station, Tex.] : Bibeau, 1978.
Subjects:
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Call Number: 1978 Thesis B581
Notes: Cushing Archival Copy (Library Use Only)
 
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Call Number: 1978 Thesis B581
 
Call Number Status Get It
1978 Thesis B581 Available