Cover Image

Yield modelling and defect tolerance in VLSI : papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987 /

Bibliographic Details
Corporate Author: International Workshop on Designing for Yield Oxford, England
Other Authors: Moore, Will, Maly, W., Strojwas, Andrzej J.
Format: Conference Proceeding Book
Language:English
Published: Bristol ; Philadelphia : A. Hilger, [1988]
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Description
Physical Description:vi, 282 pages : illustrations
Bibliography:Includes bibliographies and index.
ISBN:085274398X