Yield modelling and defect tolerance in VLSI : papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987 /

Bibliographic Details
Corporate Author:	International Workshop on Designing for Yield Oxford, England
Other Authors:	Moore, Will, Maly, W., Strojwas, Andrzej J.
Format:	Conference Proceeding Book
Language:	English
Published:	Bristol ; Philadelphia : A. Hilger, [1988]
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Congresses.

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