Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. /

Extended defects in semiconductors : electronic properties, device effects and structures /
by: Holt, D. B.
Published: (2007)

Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Porcessing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /
Published: (1998)

Defect recognition and image processing in semiconductors and devices : proceedings of the Fifth International Conference, Santander, Spain, 6-10 September 1993 /
Published: (1994)

Defect recognition and image processing in semiconductors 1995 : proceedings of the sixth international conference, held in Boulder, Colorado, 3-6 December 1995 /
Published: (1996)

High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
Published: (1990)

Identification of defects in semiconductors.
Published: (1998)

Defect engineering in semiconductor growth, processing, and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A. /
Published: (1992)

Si front-end processing : physics and technology of dopant-defect interactions II : symposium held April 24-27, 2000, San Francisco, California, USA /
Published: (2001)

Si front-end processing : physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, USA /
Published: (2001)

Si front-end processing : physics and technology of dopant-defect interactions : symposium held April 6-9, 1999, San Francisco, California, U.S.A. /
Published: (1999)

Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A. /
Published: (1983)

Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions /
by: Spaeth, Johann-Martin
Published: (2003)

Defect recognition and image processing in III-V compounds, II : proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27- 29, 1987 /
Published: (1987)

Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, USA /
Published: (1986)

Semiconductor process and device performance modeling : symposium held December 2-3, 1997, Boston, Massachusetts, U.S.A. /
Published: (1998)

Silicon carbide 2004--materials, processing and devices : symposium held April 14-15, 2004, San Francisco, California, U.S.A. /
Published: (2004)

Chemistry and defects in semiconductor heterostructures : symposium held April 24-27, 1989, San Diego, California, U.S.A. /
Published: (1989)

Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley PLaza Hotel, Boston, Massachusetts, U.S.A. /
Published: (1981)

Point and extended defects in semiconductors /
Published: (1989)

Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 /
Published: (1985)

SEM microcharacterization of semiconductors /
Published: (1989)

Semiconductor technology : processing and novel fabrication techniques /
Published: (1997)

Lattice defects in semiconductors, 1974 : invited and contributed papers from the International Conference on Lattice Defects in Semiconductors held in Freiburg, 22-25 July 1974.
Published: (1975)

Extended defects in semiconductors : electronic properties, device effects and structures /
by: Holt, D. B.
Published: (2007)

Microscopes & microscopic life /
by: Healey, Peter
Published: (1970)

Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989.
Published: (1990)

Impurities, defects, and diffusion in semiconductors : bulk and layered structures ; symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A. /
Published: (1990)

The microscope ; an introduction to microscopic methods and to histology /
by: Gage, Simon Henry, 1851-1944
Published: (1904)

The microscope /
by: Allen, Roy Morris, 1882-
Published: (1940)

The microscope /
by: Gage, Simon Henry, 1851-1944
Published: (1941)

Defects in semiconductors /
Published: (2015)

Defect complexes in semiconductor structures : proceedings of the international school held in Matrafured, Hungary, September 13-17, 1982 /
Published: (1983)

Semiconductor defect engineering--materials, synthetic structures and devices II : symposium held April 9-13, 2007, San Francisco, California, U.S.A. /
Published: (2007)

Point defects in semiconductors /
by: Lannoo, M. (Michel), 1942-
Published: (1981)

Silicon front-end technology--materials processing and modelling : symposium held April 13-15, 1998 in San Francisco, California, U.S.A. /
Published: (1998)

Defects and radiation effects in semiconductors, 1978 : invited and contributed papers from the International Conference on Defects and Radiation Effects in Semiconductors held in Nice, 11-14 September 1978 /
Published: (1979)