Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. /

Bibliographic Details
Corporate Author:	Materials Research Society
Other Authors:	Johnson, Noble M., Bishop, Stephen G., Watkins, George D.
Format:	Book
Language:	English
Published:	Pittsburgh, Pa. : Materials Research Society, [1985]
Series:	Materials Research Society symposia proceedings. v. 46.
Subjects:	Semiconductors > Defects > Congresses. Microscopes > Congresses. Microscopy > Congresses.

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