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Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. /

Bibliographic Details
Corporate Author: Materials Research Society
Other Authors: Johnson, Noble M., Bishop, Stephen G., Watkins, George D.
Format: Book
Language:English
Published: Pittsburgh, Pa. : Materials Research Society, [1985]
Series:Materials Research Society symposia proceedings. v. 46.
Subjects:
Semiconductors > Defects > Congresses.
Microscopes > Congresses.
Microscopy > Congresses.
Description
Physical Description:xv, 604 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographies and indexes.
ISBN:0931837111 :
ISSN:0272-9172 ;