APA (7th ed.) Citation

Materials Research Society, Johnson, N. M., Bishop, S. G., & Watkins, G. D. (1985). Microscopic identification of electronic defects in semiconductors: Symposium held April 15-18, 1985, San Francisco, California, U.S.A. Materials Research Society.

Chicago Style (17th ed.) Citation

Materials Research Society, Noble M. Johnson, Stephen G. Bishop, and George D. Watkins. Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A. Pittsburgh, Pa.: Materials Research Society, 1985.

MLA (9th ed.) Citation

Materials Research Society, et al. Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A. Materials Research Society, 1985.