Cover Image

Automated inspection and product control : AIPC 8 : proceedings of the 8th International Conference, 23-25 June 1987, Chicago, USA /

Bibliographic Details
Corporate Author: International Conference on Automated Inspection and Product Control
Other Authors: McKee, Keith E.
Format: Conference Proceeding Book
Language:English
Published: Bedford : Berlin ; New York : IFS (Publications) ; Springer Verlag, [1987]
Subjects:
Engineering inspection > Automation > Congresses.
Description
Physical Description:viii, 374 pages : illustrations ; 31 cm.
Bibliography:Includes bibliographies.
ISBN:0948507543 :
354018080X (West Germany)
038718080X (U.S.)