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Automated inspection and product control : AIPC 8 : proceedings of the 8th International Conference, 23-25 June 1987, Chicago, USA /

Bibliographic Details
Corporate Author: International Conference on Automated Inspection and Product Control
Other Authors: McKee, Keith E.
Format: Conference Proceeding Book
Language:English
Published: Bedford : Berlin ; New York : IFS (Publications) ; Springer Verlag, [1987]
Subjects:
Engineering inspection > Automation > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: TS156.2 .A97 1987
 
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TS156.2 .A97 1987 Available