Cover Image

Reliability physics 1980 : 18th annual proceedings, Las Vegas, Nevada, April 8-10, 1980 /

Bibliographic Details
Corporate Authors: International Reliability Physics Symposium Las Vegas, Nev., IEEE Electron Devices Society, IEEE Reliability Society
Format: Conference Proceeding Book
Language:English
Published: New York : Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, [1980]
Subjects:
Semiconductors > Reliability > Congresses.
Semiconductors > Testing > Congresses.
Integrated circuits > Reliability > Congresses.
Integrated circuits > Testing > Congresses.
Description
Item Description:On cover: IEEE 1980 International Reliability Physics.
"IEEE catalog number 80CH1531-3."
Physical Description:vii, 339 pages : illustrations, portraits ; 28 cm.
Bibliography:Includes bibliographical references.