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Reliability physics 1980 : 18th annual proceedings, Las Vegas, Nevada, April 8-10, 1980 /

Bibliographic Details
Corporate Authors: International Reliability Physics Symposium Las Vegas, Nev., IEEE Electron Devices Society, IEEE Reliability Society
Format: Conference Proceeding Book
Language:English
Published: New York : Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, [1980]
Subjects:
Semiconductors > Reliability > Congresses.
Semiconductors > Testing > Congresses.
Integrated circuits > Reliability > Congresses.
Integrated circuits > Testing > Congresses.

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Call Number: TK7871.85 .I583 1980
 
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TK7871.85 .I583 1980 Available