Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, USA /
| Other Authors: | Siegel, R. W. (Richard W.), Sinclair, Robert, Weertman, Julia R. (Julia Randall) |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Pittsburgh, Pa. :
Materials Research Society,
[1987]
|
| Series: | Materials Research Society symposia proceedings ;
v. 82. |
| Subjects: |
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