Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, USA /

Bibliographic Details
Other Authors: Siegel, R. W. (Richard W.), Sinclair, Robert, Weertman, Julia R. (Julia Randall)
Format: Book
Language:English
Published: Pittsburgh, Pa. : Materials Research Society, [1987]
Series:Materials Research Society symposia proceedings ; v. 82.
Subjects:

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