Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, USA /

Bibliographic Details
Other Authors:	Siegel, R. W. (Richard W.), Sinclair, Robert, Weertman, Julia R. (Julia Randall)
Format:	Book
Language:	English
Published:	Pittsburgh, Pa. : Materials Research Society, [1987]
Series:	Materials Research Society symposia proceedings ; v. 82.
Subjects:	Materials > Defects > Congresses. Crystals > Defects > Congresses.

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