Radiation effects in electronics.

Bibliographic Details
Corporate Authors:	Joint ANS-ASTM Conference on Radiation Effects in Electronics Syracuse, N.Y., American Nuclear Society. Niagara Finger Lakes Section, ASTM Committee E-10 on Radioisotopes and Radiation Effects
Format:	Conference Proceeding Book
Language:	English
Published:	Philadelphia : American Society for Testing and Materials, [1965]
Series:	ASTM special technical publication ; 384.
Subjects:	Semiconductors > Effect of radiation on. Electronic apparatus and appliances > Effect of radiation on.

Description
Item Description:	Consists of the major portion of the transactions of the joint meeting of ASTM Committee E-10 on Radioisotopes and Radiation Effects, and the Niagara-Finger Lakes Section of the American Nuclear Society held in Syracuse, N.Y., Oct. 5-7, 1964.
Physical Description:	236 pages : illustrations ; 24 cm.
Bibliography:	Includes bibliographical references.