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Radiation effects in electronics.

Bibliographic Details
Corporate Authors: Joint ANS-ASTM Conference on Radiation Effects in Electronics Syracuse, N.Y., American Nuclear Society. Niagara Finger Lakes Section, ASTM Committee E-10 on Radioisotopes and Radiation Effects
Format: Conference Proceeding Book
Language:English
Published: Philadelphia : American Society for Testing and Materials, [1965]
Series:ASTM special technical publication ; 384.
Subjects:
Semiconductors > Effect of radiation on.
Electronic apparatus and appliances > Effect of radiation on.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7872.S4 J62 1964
 
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TK7872.S4 J62 1964 Available