APA (7th ed.) Citation

Joint ANS-ASTM Conference on Radiation Effects in Electronics Syracuse, N.Y., American Nuclear Society. Niagara Finger Lakes Section, & ASTM Committee E-10 on Radioisotopes and Radiation Effects. (1965). Radiation effects in electronics. American Society for Testing and Materials.

Chicago Style (17th ed.) Citation

Joint ANS-ASTM Conference on Radiation Effects in Electronics Syracuse, N.Y., American Nuclear Society. Niagara Finger Lakes Section, and ASTM Committee E-10 on Radioisotopes and Radiation Effects. Radiation Effects in Electronics. Philadelphia: American Society for Testing and Materials, 1965.

MLA (9th ed.) Citation

Joint ANS-ASTM Conference on Radiation Effects in Electronics Syracuse, N.Y., et al. Radiation Effects in Electronics. American Society for Testing and Materials, 1965.