Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation /
| Corporate Authors: | International Conference on Ion Beam Surface Layer Analysis Yorktown Heights, N.Y., National Science Foundation (U.S.), International Business Machines Corporation |
|---|---|
| Other Authors: | Mayer, James W., 1930-, Ziegler, J. F. (James F.) |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Lausanne :
Elsevier Sequoia S.A.,
1974.
|
| Subjects: |
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