Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation /

Bibliographic Details
Corporate Authors: International Conference on Ion Beam Surface Layer Analysis Yorktown Heights, N.Y., National Science Foundation (U.S.), International Business Machines Corporation
Other Authors: Mayer, James W., 1930-, Ziegler, J. F. (James F.)
Format: Conference Proceeding Book
Language:English
Published: Lausanne : Elsevier Sequoia S.A., 1974.
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: QC176.82 .I55 1973
 
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QC176.82 .I55 1973 Available