Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation /
| Corporate Authors: | , , |
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| Other Authors: | , |
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Lausanne :
Elsevier Sequoia S.A.,
1974.
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| Subjects: |
| Item Description: | "These proceedings were originally published in Thin solid films." |
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| Physical Description: | viii, 463 pages : illustrations ; 25 cm. |
| Bibliography: | Includes bibliographical references. |
| ISBN: | 044419536X |