International Conference on Ion Beam Surface Layer Analysis Yorktown Heights, N.Y., National Science Foundation (U.S.), International Business Machines Corporation, Mayer, J. W., & Ziegler, J. F. (1974). Ion beam surface layer analysis: Proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation. Elsevier Sequoia S.A..
Chicago Style (17th ed.) CitationInternational Conference on Ion Beam Surface Layer Analysis Yorktown Heights, N.Y., National Science Foundation (U.S.), International Business Machines Corporation, James W. Mayer, and J. F. Ziegler. Ion Beam Surface Layer Analysis: Proceedings of the International Conference Held on June 18-20, 1973, in Yorktown Heights, N.Y., and Sponsored by the National Science Foundation and the IBM Corporation. Lausanne: Elsevier Sequoia S.A., 1974.
MLA (9th ed.) CitationInternational Conference on Ion Beam Surface Layer Analysis Yorktown Heights, N.Y., et al. Ion Beam Surface Layer Analysis: Proceedings of the International Conference Held on June 18-20, 1973, in Yorktown Heights, N.Y., and Sponsored by the National Science Foundation and the IBM Corporation. Elsevier Sequoia S.A., 1974.