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LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey /

Bibliographic Details
Corporate Authors: Test Conference Cherry Hill Township, N.J., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: New York, N.Y. : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; Available from IEEE Computer Society Publications Office, ©1979.
Subjects:
Integrated circuits > Testing > Congresses.
Integrated circuits > Large scale integration > Congresses.
Printed circuits > Testing > Congresses.
Semiconductors > Testing > Congresses.
Automatic test equipment > Congresses.
Circuits intégrés à grande échelle > Congrès.
Circuits imprimés > Essais > Congrès.
Semi-conducteurs > Essais > Congrès.
Équipement d'essai automatique > Congrès.
Automatic test equipment.
Integrated circuits > Large scale integration.
Integrated circuits > Testing.
Printed circuits > Testing.
Semiconductors > Testing.
Conference papers and proceedings.
Description
Item Description:"79CH1509-9C."
Physical Description:ii, 382 pages : illustrations ; 28 cm
Bibliography:Includes bibliographical references.