LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey /

Bibliographic Details
Corporate Authors:	Test Conference Cherry Hill Township, N.J., IEEE Computer Society. Test Technology Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	New York, N.Y. : Long Beach, Calif. : Institute of Electrical and Electronics Engineers ; Available from IEEE Computer Society Publications Office, ©1979.
Subjects:	Integrated circuits > Testing > Congresses. Integrated circuits > Large scale integration > Congresses. Printed circuits > Testing > Congresses. Semiconductors > Testing > Congresses. Automatic test equipment > Congresses. Circuits intégrés à grande échelle > Congrès. Circuits imprimés > Essais > Congrès. Semi-conducteurs > Essais > Congrès. Équipement d'essai automatique > Congrès. Automatic test equipment. Integrated circuits > Large scale integration. Integrated circuits > Testing. Printed circuits > Testing. Semiconductors > Testing. Conference papers and proceedings.

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