Optics in metrology and quality assurance : February 6-7, 1980, Los Angeles, California /
| Corporate Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
Society of Photo-optical Instrumentation Engineers,
[1980]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 220. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0220.toc |
Internet
https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/0220.tocRemote Storage
| Call Number: |
TS156.2 .O67 |
|
|---|---|---|
| Call Number | Status | Get It |
| TS156.2 .O67 | Available | |