Symposium on X-Ray and Electron Probe Analysis ; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.
| Corporate Authors: | , , |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Philadelphia :
American Society for Testing and Materials,
[1964]
|
| Series: | ASTM special technical publication ;
349. |
| Subjects: |
| Item Description: | Sponsored jointly by ASTM Committees E-2 on Emission Spectroscopy and E-4 on Electron Metallography. |
|---|---|
| Physical Description: | vi, 209 pages : illustrations ; 24 cm. |
| Bibliography: | Includes bibliographies. |