Symposium on X-Ray and Electron Probe Analysis ; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.
| Corporate Authors: | , , |
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| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Philadelphia :
American Society for Testing and Materials,
[1964]
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| Series: | ASTM special technical publication ;
349. |
| Subjects: |
Remote Storage
| Call Number: |
QD95 .S95 1963 |
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|---|---|---|
| Call Number | Status | Get It |
| QD95 .S95 1963 | Available | |