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Characterization of crystal growth defects by X-ray methods /

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Bibliographic Details
Corporate Author: NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods Durham University, England
Other Authors: Tanner, B. K. (Brian Keith), Bowen, D. Keith (David Keith), 1940-
Format: Conference Proceeding Book
Language:English
Published: New York, N.Y. : Plenum Press, [1980]
Series:NATO advanced study institutes series. Physics ; v. 63.
Subjects:
Crystals > Defects > Congresses.
X-ray crystallography > Congresses.
Description
Item Description:"Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held Aug. 29-Sept. 10, 1979, at Durham University, Durham, United Kingdom."
"Published in cooperation with NATO Scientific Affairs Division."
Physical Description:xxvi, 589 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0306406284